Electronic Devices
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TEM Expert
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RMT Ltd introduces new complex device TEM Expert DX8080 for detailed testing of performance of thermoelectric material (TEM).
The DX8080 is developed for laboratory testing of thermoelectric (TE) properties of the n/p-type material based on Bi2Te3 when measuring pellets.
The tests are performed in vacuum at a given ambient (sample) temperature.
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Features
- Seebeck coefficient a,
- Electrical Conductivity s
- Figure-of-Merit Z
- Thermal conductivity k (is calculated)
- Investigations of the properties in a temperature range
- Wholly automated vacuum testing
SPECIFICATIONS
Measuring Parameters
| Measured parameter | Designation | Units | Range | Accuracy, % |
|---|---|---|---|---|
| Seebeck Coefficient, a | mV/K | 100...300 | 3.5 | |
| Electrical Conductivity | s | 1/(Ohm·cm) | 300...2000 | 5 |
| Figure-of-Merit | Z | 1000/K | 0...4 | 7 |
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Sample Dimensions
Parameter Units Min Max Length mm 1.0 5.0 Cross-section mm2 - 3x3 Length to Cross-Section Ratio mm-1 0.5 1.0 Technical Parameters
Parameter Value Accuracy Sample temperature range, Ts 220...400K1) ±1 K Measuring Voltage, U 0.4-2.0 mV ±3.5 mV Electrical current (AC @ DC), I 5-100 mA ±30 mA Vacuum, not worse than 5·10-3 mmHg Number of samples2) 3 Current and probe wires length 15 mm Constantan wires diameter 0.05-0.08 mm Current and probe wires diameter 0.05-0.08 mm Notes:
1) At ambient temperature 293 K
2) Simultaneous measurements.Electric power consumption:
- AC voltage, - 220V +10/-15;
- Power, - not more than 500 W.
