Electronic Devices
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TEC Testers
RMT Ltd introduces a family of devices for detailed examining of thermoelectric cooling modules (TECs), for express control of TECs, measurements of thermoelectric material (TEM) performance parameters.
The range of the devices is the following:
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Z-METERS
Express examining of TECs:
- AC Resistance R,
- Thermoelectric Figure-of-Merit Z,
- Maximum Temperature Difference DTmax
- Time Constant of TE Modules t.
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TEC EXPERT
Detailed TEC testing in vacuum:
- DTmax, Qmax, Imax, Umax,
- Modeling of TEC operation in applications,
- ACR, Figure-of-Merit and Time Constant,
- Investigations in a temperature range
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TEM EXPERT
Detailed thermoelectric material (samples and pellets) testing in vacuum:
- Seebeck Coefficient a,
- Electrical Conductivity s,
- Figure-of-Merit Z,
- Thermal Conductivity k (is calculated),
- Investigations in a temperature range.
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TEM PROBE
Express automated testing of thermoelectric material bulk crystals and ingots
- Seebeck Coefficient and Electric Conductivity,
- Performance parameters profile along bulk crystal or mapping of wafers,
- Automated inspection with data output.
