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Electrical Contact Resistance in Thermoelectric Pellet Based on Bi-Sb Chalcogenides Drabkin I.A., Ershova L.B. 6th European Conference on Thermoelectrics, 2008, Paris, France
It is well-known that electric contact resistance in thermoelectric pellets causes several per cent growth of the module electrical resistance and results in the drop of its efficiency in comparison with that of the thermoelectric material and the dependence of the efficiency on the pellet length. The contact resistance also causes a dependence of the module maximum temperature difference on the pellet length. In the paper the nature of the contact resistance is studied. The reasons of the above mentioned growth can be both the presence of the broken layer on the semiconductor border and the difference between the contact actual area and the geometrical one, the latter resulting in tightening lines of the electric current. The analysis of the relative contribution of these factors is done. The relation of the contact resistance with adhesion of the antidiffusion layer is considered.
Optimization of Thermoelectric
Generator with Segmented Elements Proceedings of the 6th European Conference on Thermoelectrics, 2008, Paris, France
In designing thermoelectric generators it is common practice to apply segmented pellets, i.e. the elements of thermoelectric materials optimized for various temperature intervals. The advantage of segmented pellets in comparison with the multistage concept is the absence of thermal losses inherent in cascading. However for exact calculation of the segments length it is necessary to take into account temperature dependence of thermoelectric parameters. In this paper the procedure of calculating the dimensions of segments for a generating pellet is done by the Pontriagin maximum method, allowing for such dependences. Besides, this method allows obtaining both optimal values of segment cross-sections and taking into account restrictions imposed on these values.
Optimal Thermoelectric Cooling in Laser
Diode Applications
Thermoelectric cooling is widely used in optoelectronics and telecommunication for cooling and temperature stabilization of laser diodes. In many applications there are no alternatives to thermoelectric cooling due to provided diminutiveness, control accuracy and high reliability. The work outlines and solves the most typical optimizing problems of thermoelectric cooling for laser diode sub-assemblies in various telecommunication packages (Butterfly, HHL, ТО3, and others). Several levels of optimization are considered: that of the thermoelectric cooler itself (design and materials), optimization of a package (materials and gas filling), as well as the dependence of the efficiency on the operational conditions (ambient temperature) and heat sink thermal resistance. The offered analysis gives quantitative estimations of efficiency of optimization, allows minimizing power consumption of the system and finding an optimum both for efficiency of cooling and for reliability of a design.
Thermoelectric Cooling for Detector Applications G.G. Gromov, L.B. Ershova Proceedings of
XX International Conference on Photonics and Night Vision Devices ,
2008, Moscow, Russia
Thermoelectric cooling is widely used in optoelectronics for cooling and temperature stabilization, heat removal, maintenance of homogeneous temperature fields. In many applications there are no alternatives to thermoelectric cooling due to provided diminutiveness, control accuracy and high reliability. In modern optoelectronics there are plenty of thermoelectrically cooled photodetectors, focal plane arrays and matrices and other products. A complex of factors allows optimizing thermoelectric coolers operation in these applications. The work outlines the most typical optimizing problems of thermoelectric cooling for detector devices (photo, IR, X-ray detectors, CCD matrixes, etc.) in various packages (ТО3, ТО8, ТО5, ТО46 and others). Several levels of optimization are considered: that of the thermoelectric cooler itself (design and materials), optimization of a package (materials and gas filling), as well as the dependence of the efficiency on the operational conditions (ambient temperature) and heat sink thermal resistance. The offered analysis gives quantitative estimations of efficiency of optimization, allows minimizing power consumption of the system and finding an optimum both for efficiency of cooling and for reliability of a design.
Curl Currents
Occurrence in Homogeneous Isotropic Thermoelectric Elements
Occurrence of curl currents in thermoelectric elements has been always regarded as an extremely undesirable phenomenon resulting in an inevitable efficiency reduction of the thermoelectric material. Curl currents usually appear due to local inhomogeneities in a thermoelectric material. In the given paper the occurrence of curl currents in a homogeneous material is investigated. It is shown that in an element of the arbitrary shape the parallelism of the temperature and electric potential gradients is required to eliminate curl currents. As the electric and temperature fields in an element are described by different equations, in a general case there are no reasons for these gradients to be collinear. It means that an element of arbitrary shape always works worse than a quasi one-dimensional one, where electric and temperature fields depend on one coordinate. We prove that for quasi one-dimensional elements in conditions of thermal exchange with environment there inevitably appear curl currents in a vicinity of the element side surface. As a result, even at the zero contact resistance there are additional reasons for the cooling efficiency of the thermoelectric module to become lower than that of the thermoelectric material it is made of.
Comparison
of Approaches to Thermoelectric Modules Mathematical Optimization
For
mathematical simulation and optimization of thermoelectric (TE) modules
different methods are applied. The paper numerically compares two most
rigorous ones and shows that these approaches provide close results.
Optimal
Temperature Distribution on
the Cascades of a Multistage Thermoelectric Module
The
problem of finding the optimal sequence of temperature values on the
cascades is expressed in terms of the system of linear equations. A
multi-iteration search allows obtaining the solution with required
accuracy. The method can be used for an arbitrary selection of
thermoelectric (TE) materials on the cascades, taking into account
temperature behavior of TE parameters. The method can allow for thermal
losses on the TE module substrates.
The
Effect of the Substrates Two-Dimensional Temperature Distribution on
the TEC Performance I.A.Drabkin, L.B. Yershova, D.A. Kondratiev, G.G. Gromov Proceedings of 8th European Workshop on Thermoelectrics, 2004, Krakow, Poland
2.
G.N.Dulnev. Thermal and Mass Exchange in Radioelectronic Devices, Moscow,
1984, pp. 227-230
Methods
of Reducing Heat Losses on the Intermediate Substrates of Multistage
TE Modules I.A.Drabkin,
Z.M.Dashevsky, L.B. Yershova, G.G. Gromov
Temperature distribution on intermediate substrates of multistage thermoelectric (TE) modules is analyzed. It is shown that, depending on various thermal conditions of TE pellets operation, the temperature in the center of the substrate may significantly exceed the temperature on its edges, especially if the substrate material has a relatively low value of thermal conductivity (for example, ceramics based on Al2O3). To reduce heat losses it is suggested that TE modules with pellets cross-section widely varying from stage to stage should be applied. It results in decreasing intermediate substrates sizes and thus intensifying the heat flux density across them. This heat flux density growth makes the TE module more efficient as the pellets on the edge of the substrates are better involved in cooling. Some practical approaches of realizing this idea with the pellets connected in series and in parallel are studied.
Some
Aspects on Thermoelectric Cooler Optimization for Applications in
Photodetectors Arakelov
G.A., Yershova L.B., Gromov G.G. Proceedings of
18th International Conference on Photonics and Night Vision Devices ,
2004, Moscow, Russia
There is a known practice to select a
thermoelectric cooler (TEC) for application in photodetectors (PD) by the
estimation of so-called maximal TEC parameters: maximal current Imax,
voltage drop Umax, temperature difference DTmax and cooling capacity Qmax. DTmax
at Q=0. This practice is due to the fact that these
maximal parameters are available as standard performance characteristics
of TECs specifications, commonly applied in the international market. But theoretical and experimental
investigations demonstrate that an optimal TEC for a PD application and
its most suitable operation parameters depend on a range of factors and
application conditions. At a given value of thermal resistance of
heat sink onto which PD is mounted there are real
parameters of TEC I0<Imax and U0<Umax
that provide the optimal operation of the “PD+heat sink” system.
Between two similar TECs with equal values of their Imax the
type with higher Umax is preferable. In the paper the example of optimal TEC
estimation for the application in a 64-element PD array is advised.
Complex
Method to Control the Quality of Construction and Performance
Reliability of Thermoelectric Modules in Optoelectronic Devices L.B. Yershova, G.G. Gromov, I.A.Drabkin
Proceedings of 18th International Conference on Photonics and Night Vision
Devices , 2004, Moscow, Russia
International
and national standards require high reliability from thermoelectric (TE)
modules applied in optoelectronic devices. A standard criterion is the
measurement and specification of the module electric resistance (R).
At the manufacturing stage the module TE figure-of-merit (Z) is also
controlled by the Harman method
[[i],
[ii],
[iii]].
Paper [[iv]]
suggested a complex quality control method by measuring TE module R, Z and
time constant (t).
As a follow-up of this approach the given paper shows the advantages of
the complex (R, Z, t)-measurement
for estimating the quality of assemblies based on TE modules as well as
modules reliability control or failure while operating in optoelectronic
devices. Theoretical backgrounds and experimental results are offered. The
measurements were carried out with the help of Z, R, t-meters
of the DX4065 and DX4165 series produced by RMT Ltd.
[i].
V.P.Babin,S.M.Gorodetskiy.
Thermoelectric modules quality testing by a manufacturer. Proc. XIV
Int. Conf. on Thermoelectrics, June 27-30,
St. Petersburg, Russia, 1995,pp. 338-340 [ii].
R.J.
Buist. A new method for Testing Thermoelectric materials and Devices/Proc.XI
Int. Conf. on Thermoelectrics. October 7-9,1992,Arlington, TX, USA. [iii].
Gromov G., Yershova L et al, “Z-meter: Easy-to-use
Application and Theory”. Proc. VI Eur. Workshop on Thermoelectrics,
Freiburg, September, 2001. [iv].
L.B. Yershova, G.G. Gromov, I.A.Drabkin. Complex Express TEC Testing. Proc.
XXII Int. Conf. on Thermoelectrics, August 17-21, La Grande Motte,
France, 2003 (printing)
For express Thermoelectric Coolers (TEC) control in manufacturing and application, electrical resistance (R) and Figure-of-Merit (Z) measurement is widely spread. In the paper it is shown that there are TEC damage or defect instances not covered by one-parameter testing (R) and even two-parameter testing (R, Z). We offer a three-parameter approach to control TEC’s quality: by measuring TEC electrical resistance (R), Figure-of-Merit (Z) and time constant (t). This method provides possibilities to diagnose TEC defect, which is of vital concern for technology and operational conditions correction. The paper yields theoretical and experimental results proving it. The experimental check is provided with the help of the original testing device R,Z,t-meter DX3065.
Measuring
Methods of Thermoelectric Coolers Non-stationary Dynamics
in
Z-metering
Temporal characteristics of a thermoelectric cooler (TEC) are important performance parameters for any device involving TEC. In paper [i] there are derived expressions for the time relaxation of single and two-stage multistage TEC. This paper studies transient processes concerned in figure-of-merit measurements with the Z-meter. It compares experimental and theoretical results and yields the evaluating approach for obtaining relaxation time values in real thermoelectric devices.
Thermoelectric Cooling for Low Temperature Space Environment
The paper presents a multi-incremental work on the thermoelectric cooler (TEC) development for planetary space instrumentation. The technical specifications designated for cooling an infrared focal plane array detector involved strict dimensional, electrical and thermal constraints. The latter ones are the following: the operational temperature range is 160-180K and the cold side temperature to maintain is not higher than 140K at the heat nominally to be pumped 50mW. Within this guidance the optimum TEC was elaborated. That is a three-stage module with different pellets occupation density based on the low temperature optimized thermoelectric materials and improved thermal conductance substrates. The technology and assembling update was carried out. The reliability testing was performed. The compliance of the theory and experiment was verified and the results allow concluding that Mars-type mission requirements are met.
Thermoelectric Cooling Modules
Although
thermoelectric phenomena were discovered more than 150 years ago,
thermoelectric devices (TE modules) have only become commercially applied
during recent decades. Actually for some period of time commercial
thermoelectrics has been developing in parallel with two mainstream
directions of technical progress – electronics and photonics,
particularly optoelectronics and laser technique.Lately
one can observe dramatical increase of application of thermoelectric
solutions in optoelectronic devices: diode lasers, ptotodetectors, solid
stage pumped lasers, charge coupled devices (CCDs) and others.
Z-meter: Easy-to-use Application and Theory
The paper is divided into two parts. The first part is an
applying one. We present a handy, easy-to-operate user-addressing Z-meter.
The device provides measurement of thermoelectric (TE) modules parameters:
AC resistance (R), thermoelectric figure-of-merit (Z) and maximum
temperature difference (DTmax).
TE Coolers Computer Simulation:
Incremental Upgrading of Rate Equations Approach
Thermoelectric (TE) technique and TE Cooler (TEC) exposure becoming more and more involved, both a manufacturer and a user are facing the problem of modeling and characterizing TEC mathematically. We suggest one of the approaches to do it based on (quasi-) tri-diagonal rate matrix of rate equations describing one-dimensional thermal dynamics through all intermediate stages and layers, including ceramics and solders, as well as a possible housing and temperature dependence of the parameters.
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