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TEM PROBE
[ TEC Expert ] [ Z-Meters ] [ TEM Probe ] [ TEM Expert ]
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RMT
Ltd introduces new device - TEM Probe DX8070
for automated inspection of bulk
crystals of thermoelectric material (TEM).
The devices is developed to examine in express mode bulk
crystals
of
thermoelectric material made by crystal growth, hot pressing, extrusion
and other manufacturing methods.
It is suitable for income control for
thermoelectric materials.
FEATURES
 |
Seebeck Coefficient and Electric
Conductivity |
|
Performance parameters profile
along bulk crystal or mapping of wafers |
|
Automated inspection with data
output |
|
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SPECIFICATIONS
Measuring Parameters
|
Parameter
measured |
Units |
Designation |
Values |
Accuracy, % |
|
Seebeck
Coefficient |
mV/K |
a |
100
300 |
3 |
|
Electrical
Conductivity |
1/(Ohm·cm) |
s |
300
2000 |
5 |
Sample Dimensions
|
Parameter |
Units |
Min |
Max |
|
Ingot |
|
Length |
mm |
40 |
110 |
|
Diameter |
mm |
20 |
25* |
|
Wafers |
|
Thickness |
mm |
0.1 |
30 |
|
Diameter |
mm |
20 |
25* |
Note:
* - larger diameter is available on request.
Technical Parameters
|
Parameter |
Units |
Values |
|
Step between the nearest
Points, d |
mm |
0.1-100 |
|
Accuracy of the Probe
Positioning,
Dx |
mm |
0.02 |
|
Positioning
Repeatability,
dx |
mm |
±0.04 |
|
Total Probe Travel
Length, L |
mm |
0
200 |
|
Voltage Range, U |
mV |
0.01
2 |
|
Voltage Accuracy,
DU |
mV |
±3.5 |
|
Ambient Temperature
Accuracy,
DТamb |
K |
0.5 |
|
Sample Electric Current,
I |
А |
0.5 5 |
|
Power Supply, AC V |
V |
220+10/-15 |
|
Power Consumption, P |
W |
> 200 |
|
Operation Temperature, Ta |
șC |
25±3 |
|
Ambient Humidity, RH |
% |
< 80 |
|
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